The core challenge in wet etching is maintaining uniformity while managing chemical efficiency. A highly controlled etching process minimizes uniformity variation and guarantees excellent repeatability across all wafer batches, whether utilizing HF, KOH, or complex acid mixtures.
Possible FEOL & BEOL Process Applications
Highly selective etching of alloys such as AlCu, AlSi, or AlSiCu.
Complete removal of silicon residues (freckles) and precise barrier structuring (Ti, TiN, TiW).
Implementation of BOE, BHF, or HF-based mixtures, often achieving < 1% in-wafer uniformity.
Targeted structuring for MEMS utilizing KOH or TMAH under strict temperature control.
Creation of micro-channels and flow cells through highly concentrated HF processes.
Proven Efficiency Gains
By replacing 4x semi-automated wet benches and 2x spin-rinse-dryers with a single BATCHSPRAY® Acid system, fabs achieve significant operational improvements:
Reduction in exhaust consumption comparing 4x semi-automated wet benches with 1x BATCHSPRAY® Acid.
*Compared to conventional processes. Numbers vary based on application.
Equipment for etching applications
FAQs
High uniformity is achieved by optimizing the chemical exchange rate across the wafer surface. Controlling fluid dynamics and temperature minimizes non-linear etch rates, consistently delivering uniformity below 3% (and often < 1% for oxide etches).
The processes accommodate a wide range of chemistries, including H₂SO₄, HF, NH₄OH, KOH, HNO₃, BHF, BOE, KOH, TMAH, and various metal-etching acid mixtures, tailored to specific selectivity requirements.
In many applications, yes. With advanced process control, wet etching offers a highly selective, cost-effective alternative to dry etching, particularly when combined with post-etch residue cleaning to ensure defect-free surfaces.